SHMT

High precision durable Wire Probe

Suitable for 4-wire, HDI, IC Substrate, FPCB and other Open/Short fixtures.
The probe contact surface is treated with gold plating.
The probe is made of epoxide as an insulating layer, which can effectively block micro electric current.
Excellent electrical and mechanical performance, probe quality is tested by durability and testing ability. High probe durability.

Wire Probe specification

HS wire probe tip Tungsten Au-Plating diameter specifications is Φ40um ~ Φ110um
and the tip of the insulation exposed length can also be designed according to customer requirements.
Use the F.E.M (Finite Element Method) analysis to create the most suitable design.
We can provide the best product quality and solution for the functions of Contact Pressure and testing.