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High precision durable Wire Probe
- Suitable for 4-wire, HDI, IC Substrate, FPCB and other Open/Short fixtures.
- The probe contact surface is treated with gold plating.
- The probe is made of epoxide as an insulating layer, which can effectively block micro electric current.
- Excellent electrical and mechanical performance, probe quality is tested by durability and testing ability. High probe durability.
Wire Probe specification
- HS wire probe tip Tungsten Au-Plating diameter specifications is Φ40um ~ Φ110um
and the tip of the insulation exposed length can also be designed according to customer requirements.
- Use the F.E.M (Finite Element Method) analysis to create the most suitable design.
We can provide the best product quality and solution for the functions of Contact Pressure and testing.